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authorCarl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>2008-11-28 23:45:27 +0000
committerCarl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>2008-11-28 23:45:27 +0000
commitf86f1fe961f661a0c892bdd6de94007cc1466c01 (patch)
treef77250f688951ed90576078f9fd67f86f1dba07c /util/flashrom/flash.h
parentf22ce41840ae966a6f465e90c8f05aed9ae5ef6b (diff)
downloadcoreboot-f86f1fe961f661a0c892bdd6de94007cc1466c01.tar.xz
If a chip has any TEST_BAD_* flag set, we don't even list the
unsupported functions, giving the user the impression that the unsupported functions are tested. Signed-off-by: Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net> Acked-by: Peter Stuge <peter@stuge.se> git-svn-id: svn://svn.coreboot.org/coreboot/trunk@3780 2b7e53f0-3cfb-0310-b3e9-8179ed1497e1
Diffstat (limited to 'util/flashrom/flash.h')
-rw-r--r--util/flashrom/flash.h3
1 files changed, 2 insertions, 1 deletions
diff --git a/util/flashrom/flash.h b/util/flashrom/flash.h
index cbc2e48a87..70a390f2f3 100644
--- a/util/flashrom/flash.h
+++ b/util/flashrom/flash.h
@@ -95,6 +95,7 @@ struct flashchip {
#define TEST_BAD_READ (1<<5)
#define TEST_BAD_ERASE (1<<6)
#define TEST_BAD_WRITE (1<<7)
+#define TEST_BAD_PREW (TEST_BAD_PROBE|TEST_BAD_READ|TEST_BAD_ERASE|TEST_BAD_WRITE)
#define TEST_BAD_MASK 0xf0
extern struct flashchip flashchips[];
@@ -106,7 +107,7 @@ extern struct flashchip flashchips[];
*
* All LPC/FWH parts (parallel flash) have 8-bit device IDs if there is no
* continuation code.
- * All SPI parts have 16-bit device IDs.
+ * SPI parts have 16-bit device IDs if they support RDID.
*/
#define GENERIC_DEVICE_ID 0xffff /* Only match the vendor ID */