summaryrefslogtreecommitdiff
path: root/ext/mcpat/cacti/wire.cc
diff options
context:
space:
mode:
Diffstat (limited to 'ext/mcpat/cacti/wire.cc')
-rw-r--r--ext/mcpat/cacti/wire.cc832
1 files changed, 832 insertions, 0 deletions
diff --git a/ext/mcpat/cacti/wire.cc b/ext/mcpat/cacti/wire.cc
new file mode 100644
index 000000000..742000c85
--- /dev/null
+++ b/ext/mcpat/cacti/wire.cc
@@ -0,0 +1,832 @@
+/*****************************************************************************
+ * McPAT/CACTI
+ * SOFTWARE LICENSE AGREEMENT
+ * Copyright 2012 Hewlett-Packard Development Company, L.P.
+ * All Rights Reserved
+ *
+ * Redistribution and use in source and binary forms, with or without
+ * modification, are permitted provided that the following conditions are
+ * met: redistributions of source code must retain the above copyright
+ * notice, this list of conditions and the following disclaimer;
+ * redistributions in binary form must reproduce the above copyright
+ * notice, this list of conditions and the following disclaimer in the
+ * documentation and/or other materials provided with the distribution;
+ * neither the name of the copyright holders nor the names of its
+ * contributors may be used to endorse or promote products derived from
+ * this software without specific prior written permission.
+
+ * THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS
+ * "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT
+ * LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR
+ * A PARTICULAR PURPOSE ARE DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT
+ * OWNER OR CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
+ * SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT
+ * LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE,
+ * DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY
+ * THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT
+ * (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE
+ * OF THIS SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.”
+ *
+ ***************************************************************************/
+
+#include "wire.h"
+#include "cmath"
+// use this constructor to calculate wire stats
+Wire::Wire(
+ enum Wire_type wire_model,
+ double wl,
+ int n,
+ double w_s,
+ double s_s,
+ enum Wire_placement wp,
+ double resistivity,
+ TechnologyParameter::DeviceType *dt
+ ):wt(wire_model), wire_length(wl*1e-6), nsense(n), w_scale(w_s), s_scale(s_s),
+ resistivity(resistivity), deviceType(dt)
+{
+ wire_placement = wp;
+ min_w_pmos = deviceType->n_to_p_eff_curr_drv_ratio*g_tp.min_w_nmos_;
+ in_rise_time = 0;
+ out_rise_time = 0;
+ if (initialized != 1) {
+ cout << "Wire not initialized. Initializing it with default values\n";
+ Wire winit;
+ }
+ calculate_wire_stats();
+ // change everything back to seconds, microns, and Joules
+ repeater_spacing *= 1e6;
+ wire_length *= 1e6;
+ wire_width *= 1e6;
+ wire_spacing *= 1e6;
+ assert(wire_length > 0);
+ assert(power.readOp.dynamic > 0);
+ assert(power.readOp.leakage > 0);
+ assert(power.readOp.gate_leakage > 0);
+}
+
+ // the following values are for peripheral global technology
+ // specified in the input config file
+ Component Wire::global;
+ Component Wire::global_5;
+ Component Wire::global_10;
+ Component Wire::global_20;
+ Component Wire::global_30;
+ Component Wire::low_swing;
+
+ int Wire::initialized;
+ double Wire::wire_width_init;
+ double Wire::wire_spacing_init;
+
+
+Wire::Wire(double w_s, double s_s, enum Wire_placement wp, double resis, TechnologyParameter::DeviceType *dt)
+{
+ w_scale = w_s;
+ s_scale = s_s;
+ deviceType = dt;
+ wire_placement = wp;
+ resistivity = resis;
+ min_w_pmos = deviceType->n_to_p_eff_curr_drv_ratio * g_tp.min_w_nmos_;
+ in_rise_time = 0;
+ out_rise_time = 0;
+
+ switch (wire_placement)
+ {
+ case outside_mat: wire_width = g_tp.wire_outside_mat.pitch; break;
+ case inside_mat : wire_width = g_tp.wire_inside_mat.pitch; break;
+ default: wire_width = g_tp.wire_local.pitch; break;
+ }
+
+ wire_spacing = wire_width;
+
+ wire_width *= (w_scale * 1e-6/2) /* (m) */;
+ wire_spacing *= (s_scale * 1e-6/2) /* (m) */;
+
+ initialized = 1;
+ init_wire();
+ wire_width_init = wire_width;
+ wire_spacing_init = wire_spacing;
+
+ assert(power.readOp.dynamic > 0);
+ assert(power.readOp.leakage > 0);
+ assert(power.readOp.gate_leakage > 0);
+}
+
+
+
+Wire::~Wire()
+{
+}
+
+
+
+void
+Wire::calculate_wire_stats()
+{
+
+ if (wire_placement == outside_mat) {
+ wire_width = g_tp.wire_outside_mat.pitch;
+ }
+ else if (wire_placement == inside_mat) {
+ wire_width = g_tp.wire_inside_mat.pitch;
+ }
+ else {
+ wire_width = g_tp.wire_local.pitch;
+ }
+
+ wire_spacing = wire_width;
+
+ wire_width *= (w_scale * 1e-6/2) /* (m) */;
+ wire_spacing *= (s_scale * 1e-6/2) /* (m) */;
+
+
+ if (wt != Low_swing) {
+
+ // delay_optimal_wire();
+
+ if (wt == Global) {
+ delay = global.delay * wire_length;
+ power.readOp.dynamic = global.power.readOp.dynamic * wire_length;
+ power.readOp.leakage = global.power.readOp.leakage * wire_length;
+ power.readOp.gate_leakage = global.power.readOp.gate_leakage * wire_length;
+ repeater_spacing = global.area.w;
+ repeater_size = global.area.h;
+ area.set_area((wire_length/repeater_spacing) *
+ compute_gate_area(INV, 1, min_w_pmos * repeater_size,
+ g_tp.min_w_nmos_ * repeater_size, g_tp.cell_h_def));
+ }
+ else if (wt == Global_5) {
+ delay = global_5.delay * wire_length;
+ power.readOp.dynamic = global_5.power.readOp.dynamic * wire_length;
+ power.readOp.leakage = global_5.power.readOp.leakage * wire_length;
+ power.readOp.gate_leakage = global_5.power.readOp.gate_leakage * wire_length;
+ repeater_spacing = global_5.area.w;
+ repeater_size = global_5.area.h;
+ area.set_area((wire_length/repeater_spacing) *
+ compute_gate_area(INV, 1, min_w_pmos * repeater_size,
+ g_tp.min_w_nmos_ * repeater_size, g_tp.cell_h_def));
+ }
+ else if (wt == Global_10) {
+ delay = global_10.delay * wire_length;
+ power.readOp.dynamic = global_10.power.readOp.dynamic * wire_length;
+ power.readOp.leakage = global_10.power.readOp.leakage * wire_length;
+ power.readOp.gate_leakage = global_10.power.readOp.gate_leakage * wire_length;
+ repeater_spacing = global_10.area.w;
+ repeater_size = global_10.area.h;
+ area.set_area((wire_length/repeater_spacing) *
+ compute_gate_area(INV, 1, min_w_pmos * repeater_size,
+ g_tp.min_w_nmos_ * repeater_size, g_tp.cell_h_def));
+ }
+ else if (wt == Global_20) {
+ delay = global_20.delay * wire_length;
+ power.readOp.dynamic = global_20.power.readOp.dynamic * wire_length;
+ power.readOp.leakage = global_20.power.readOp.leakage * wire_length;
+ power.readOp.gate_leakage = global_20.power.readOp.gate_leakage * wire_length;
+ repeater_spacing = global_20.area.w;
+ repeater_size = global_20.area.h;
+ area.set_area((wire_length/repeater_spacing) *
+ compute_gate_area(INV, 1, min_w_pmos * repeater_size,
+ g_tp.min_w_nmos_ * repeater_size, g_tp.cell_h_def));
+ }
+ else if (wt == Global_30) {
+ delay = global_30.delay * wire_length;
+ power.readOp.dynamic = global_30.power.readOp.dynamic * wire_length;
+ power.readOp.leakage = global_30.power.readOp.leakage * wire_length;
+ power.readOp.gate_leakage = global_30.power.readOp.gate_leakage * wire_length;
+ repeater_spacing = global_30.area.w;
+ repeater_size = global_30.area.h;
+ area.set_area((wire_length/repeater_spacing) *
+ compute_gate_area(INV, 1, min_w_pmos * repeater_size,
+ g_tp.min_w_nmos_ * repeater_size, g_tp.cell_h_def));
+ }
+ out_rise_time = delay*repeater_spacing/deviceType->Vth;
+ }
+ else if (wt == Low_swing) {
+ low_swing_model ();
+ repeater_spacing = wire_length;
+ repeater_size = 1;
+ }
+ else {
+ assert(0);
+ }
+}
+
+
+
+/*
+ * The fall time of an input signal to the first stage of a circuit is
+ * assumed to be same as the fall time of the output signal of two
+ * inverters connected in series (refer: CACTI 1 Technical report,
+ * section 6.1.3)
+ */
+ double
+Wire::signal_fall_time ()
+{
+
+ /* rise time of inverter 1's output */
+ double rt;
+ /* fall time of inverter 2's output */
+ double ft;
+ double timeconst;
+
+ timeconst = (drain_C_(g_tp.min_w_nmos_, NCH, 1, 1, g_tp.cell_h_def) +
+ drain_C_(min_w_pmos, PCH, 1, 1, g_tp.cell_h_def) +
+ gate_C(min_w_pmos + g_tp.min_w_nmos_, 0)) *
+ tr_R_on(min_w_pmos, PCH, 1);
+ rt = horowitz (0, timeconst, deviceType->Vth/deviceType->Vdd, deviceType->Vth/deviceType->Vdd, FALL) / (deviceType->Vdd - deviceType->Vth);
+ timeconst = (drain_C_(g_tp.min_w_nmos_, NCH, 1, 1, g_tp.cell_h_def) +
+ drain_C_(min_w_pmos, PCH, 1, 1, g_tp.cell_h_def) +
+ gate_C(min_w_pmos + g_tp.min_w_nmos_, 0)) *
+ tr_R_on(g_tp.min_w_nmos_, NCH, 1);
+ ft = horowitz (rt, timeconst, deviceType->Vth/deviceType->Vdd, deviceType->Vth/deviceType->Vdd, RISE) / deviceType->Vth;
+ return ft;
+}
+
+
+
+double Wire::signal_rise_time ()
+{
+
+ /* rise time of inverter 1's output */
+ double ft;
+ /* fall time of inverter 2's output */
+ double rt;
+ double timeconst;
+
+ timeconst = (drain_C_(g_tp.min_w_nmos_, NCH, 1, 1, g_tp.cell_h_def) +
+ drain_C_(min_w_pmos, PCH, 1, 1, g_tp.cell_h_def) +
+ gate_C(min_w_pmos + g_tp.min_w_nmos_, 0)) *
+ tr_R_on(g_tp.min_w_nmos_, NCH, 1);
+ rt = horowitz (0, timeconst, deviceType->Vth/deviceType->Vdd, deviceType->Vth/deviceType->Vdd, RISE) / deviceType->Vth;
+ timeconst = (drain_C_(g_tp.min_w_nmos_, NCH, 1, 1, g_tp.cell_h_def) +
+ drain_C_(min_w_pmos, PCH, 1, 1, g_tp.cell_h_def) +
+ gate_C(min_w_pmos + g_tp.min_w_nmos_, 0)) *
+ tr_R_on(min_w_pmos, PCH, 1);
+ ft = horowitz (rt, timeconst, deviceType->Vth/deviceType->Vdd, deviceType->Vth/deviceType->Vdd, FALL) / (deviceType->Vdd - deviceType->Vth);
+ return ft; //sec
+}
+
+
+
+/* Wire resistance and capacitance calculations
+ * wire width
+ *
+ * /__/
+ * | |
+ * | | height = ASPECT_RATIO*wire width (ASPECT_RATIO = 2.2, ref: ITRS)
+ * |__|/
+ *
+ * spacing between wires in same level = wire width
+ * spacing between wires in adjacent levels = wire width---this is incorrect,
+ * according to R.Ho's paper and thesis. ILD != wire width
+ *
+ */
+
+double Wire::wire_cap (double len /* in m */, bool call_from_outside)
+{
+ //TODO: this should be consistent with the wire_res in technology file
+ double sidewall, adj, tot_cap;
+ double wire_height;
+ double epsilon0 = 8.8542e-12;
+ double aspect_ratio, horiz_dielectric_constant, vert_dielectric_constant, miller_value,ild_thickness;
+
+ switch (wire_placement)
+ {
+ case outside_mat:
+ {
+ aspect_ratio = g_tp.wire_outside_mat.aspect_ratio;
+ horiz_dielectric_constant = g_tp.wire_outside_mat.horiz_dielectric_constant;
+ vert_dielectric_constant = g_tp.wire_outside_mat.vert_dielectric_constant;
+ miller_value = g_tp.wire_outside_mat.miller_value;
+ ild_thickness = g_tp.wire_outside_mat.ild_thickness;
+ break;
+ }
+ case inside_mat :
+ {
+ aspect_ratio = g_tp.wire_inside_mat.aspect_ratio;
+ horiz_dielectric_constant = g_tp.wire_inside_mat.horiz_dielectric_constant;
+ vert_dielectric_constant = g_tp.wire_inside_mat.vert_dielectric_constant;
+ miller_value = g_tp.wire_inside_mat.miller_value;
+ ild_thickness = g_tp.wire_inside_mat.ild_thickness;
+ break;
+ }
+ default:
+ {
+ aspect_ratio = g_tp.wire_local.aspect_ratio;
+ horiz_dielectric_constant = g_tp.wire_local.horiz_dielectric_constant;
+ vert_dielectric_constant = g_tp.wire_local.vert_dielectric_constant;
+ miller_value = g_tp.wire_local.miller_value;
+ ild_thickness = g_tp.wire_local.ild_thickness;
+ break;
+ }
+ }
+
+ if (call_from_outside)
+ {
+ wire_width *= 1e-6;
+ wire_spacing *= 1e-6;
+ }
+ wire_height = wire_width/w_scale*aspect_ratio;
+ /*
+ * assuming height does not change. wire_width = width_original*w_scale
+ * So wire_height does not change as wire width increases
+ */
+
+// capacitance between wires in the same level
+// sidewall = 2*miller_value * horiz_dielectric_constant * (wire_height/wire_spacing)
+// * epsilon0;
+
+ sidewall = miller_value * horiz_dielectric_constant * (wire_height/wire_spacing)
+ * epsilon0;
+
+
+ // capacitance between wires in adjacent levels
+ //adj = miller_value * vert_dielectric_constant *w_scale * epsilon0;
+ //adj = 2*vert_dielectric_constant *wire_width/(ild_thickness*1e-6) * epsilon0;
+
+ adj = miller_value *vert_dielectric_constant *wire_width/(ild_thickness*1e-6) * epsilon0;
+ //Change ild_thickness from micron to M
+
+ //tot_cap = (sidewall + adj + (deviceType->C_fringe * 1e6)); //F/m
+ tot_cap = (sidewall + adj + (g_tp.fringe_cap * 1e6)); //F/m
+
+ if (call_from_outside)
+ {
+ wire_width *= 1e6;
+ wire_spacing *= 1e6;
+ }
+ return (tot_cap*len); // (F)
+}
+
+
+ double
+Wire::wire_res (double len /*(in m)*/)
+{
+
+ double aspect_ratio,alpha_scatter =1.05, dishing_thickness=0, barrier_thickness=0;
+ //TODO: this should be consistent with the wire_res in technology file
+ //The whole computation should be consistent with the wire_res in technology.cc too!
+
+ switch (wire_placement)
+ {
+ case outside_mat:
+ {
+ aspect_ratio = g_tp.wire_outside_mat.aspect_ratio;
+ break;
+ }
+ case inside_mat :
+ {
+ aspect_ratio = g_tp.wire_inside_mat.aspect_ratio;
+ break;
+ }
+ default:
+ {
+ aspect_ratio = g_tp.wire_local.aspect_ratio;
+ break;
+ }
+ }
+ return (alpha_scatter * resistivity * 1e-6 * len/((aspect_ratio*wire_width/w_scale-dishing_thickness - barrier_thickness)*
+ (wire_width-2*barrier_thickness)));
+}
+
+/*
+ * Calculates the delay, power and area of the transmitter circuit.
+ *
+ * The transmitter delay is the sum of nand gate delay, inverter delay
+ * low swing nmos delay, and the wire delay
+ * (ref: Technical report 6)
+ */
+ void
+Wire::low_swing_model()
+{
+ double len = wire_length;
+ double beta = pmos_to_nmos_sz_ratio();
+
+
+ double inputrise = (in_rise_time == 0) ? signal_rise_time() : in_rise_time;
+
+ /* Final nmos low swing driver size calculation:
+ * Try to size the driver such that the delay
+ * is less than 8FO4.
+ * If the driver size is greater than
+ * the max allowable size, assume max size for the driver.
+ * In either case, recalculate the delay using
+ * the final driver size assuming slow input with
+ * finite rise time instead of ideal step input
+ *
+ * (ref: Technical report 6)
+ */
+ double cwire = wire_cap(len); /* load capacitance */
+ double rwire = wire_res(len);
+
+#define RES_ADJ (8.6) // Increase in resistance due to low driving vol.
+
+ double driver_res = (-8*g_tp.FO4/(log(0.5) * cwire))/RES_ADJ;
+ double nsize = R_to_w(driver_res, NCH);
+
+ nsize = MIN(nsize, g_tp.max_w_nmos_);
+ nsize = MAX(nsize, g_tp.min_w_nmos_);
+
+ if(rwire*cwire > 8*g_tp.FO4)
+ {
+ nsize = g_tp.max_w_nmos_;
+ }
+
+ // size the inverter appropriately to minimize the transmitter delay
+ // Note - In order to minimize leakage, we are not adding a set of inverters to
+ // bring down delay. Instead, we are sizing the single gate
+ // based on the logical effort.
+ double st_eff = sqrt((2+beta/1+beta)*gate_C(nsize, 0)/(gate_C(2*g_tp.min_w_nmos_, 0)
+ + gate_C(2*min_w_pmos, 0)));
+ double req_cin = ((2+beta/1+beta)*gate_C(nsize, 0))/st_eff;
+ double inv_size = req_cin/(gate_C(min_w_pmos, 0) + gate_C(g_tp.min_w_nmos_, 0));
+ inv_size = MAX(inv_size, 1);
+
+ /* nand gate delay */
+ double res_eq = (2 * tr_R_on(g_tp.min_w_nmos_, NCH, 1));
+ double cap_eq = 2 * drain_C_(min_w_pmos, PCH, 1, 1, g_tp.cell_h_def) +
+ drain_C_(2*g_tp.min_w_nmos_, NCH, 1, 1, g_tp.cell_h_def) +
+ gate_C(inv_size*g_tp.min_w_nmos_, 0) +
+ gate_C(inv_size*min_w_pmos, 0);
+
+ double timeconst = res_eq * cap_eq;
+
+ delay = horowitz(inputrise, timeconst, deviceType->Vth/deviceType->Vdd,
+ deviceType->Vth/deviceType->Vdd, RISE);
+ double temp_power = cap_eq*deviceType->Vdd*deviceType->Vdd;
+
+ inputrise = delay / (deviceType->Vdd - deviceType->Vth); /* for the next stage */
+
+ /* Inverter delay:
+ * The load capacitance of this inv depends on
+ * the gate capacitance of the final stage nmos
+ * transistor which in turn depends on nsize
+ */
+ res_eq = tr_R_on(inv_size*min_w_pmos, PCH, 1);
+ cap_eq = drain_C_(inv_size*min_w_pmos, PCH, 1, 1, g_tp.cell_h_def) +
+ drain_C_(inv_size*g_tp.min_w_nmos_, NCH, 1, 1, g_tp.cell_h_def) +
+ gate_C(nsize, 0);
+ timeconst = res_eq * cap_eq;
+
+ delay += horowitz(inputrise, timeconst, deviceType->Vth/deviceType->Vdd,
+ deviceType->Vth/deviceType->Vdd, FALL);
+ temp_power += cap_eq*deviceType->Vdd*deviceType->Vdd;
+
+
+ transmitter.delay = delay;
+ transmitter.power.readOp.dynamic = temp_power*2; /* since it is a diff. model*/
+ transmitter.power.readOp.leakage = deviceType->Vdd *
+ (4 * cmos_Isub_leakage(g_tp.min_w_nmos_, min_w_pmos, 2, nand) +
+ 4 * cmos_Isub_leakage(g_tp.min_w_nmos_, min_w_pmos, 1, inv));
+
+ transmitter.power.readOp.gate_leakage = deviceType->Vdd *
+ (4 * cmos_Ig_leakage(g_tp.min_w_nmos_, min_w_pmos, 2, nand) +
+ 4 * cmos_Ig_leakage(g_tp.min_w_nmos_, min_w_pmos, 1, inv));
+
+ inputrise = delay / deviceType->Vth;
+
+ /* nmos delay + wire delay */
+ cap_eq = cwire + drain_C_(nsize, NCH, 1, 1, g_tp.cell_h_def)*2 +
+ nsense * sense_amp_input_cap(); //+receiver cap
+ /*
+ * NOTE: nmos is used as both pull up and pull down transistor
+ * in the transmitter. This is because for low voltage swing, drive
+ * resistance of nmos is less than pmos
+ * (for a detailed graph ref: On-Chip Wires: Scaling and Efficiency)
+ */
+ timeconst = (tr_R_on(nsize, NCH, 1)*RES_ADJ) * (cwire +
+ drain_C_(nsize, NCH, 1, 1, g_tp.cell_h_def)*2) +
+ rwire*cwire/2 +
+ (tr_R_on(nsize, NCH, 1)*RES_ADJ + rwire) *
+ nsense * sense_amp_input_cap();
+
+ /*
+ * since we are pre-equalizing and overdriving the low
+ * swing wires, the net time constant is less
+ * than the actual value
+ */
+ delay += horowitz(inputrise, timeconst, deviceType->Vth/deviceType->Vdd, .25, 0);
+#define VOL_SWING .1
+ temp_power += cap_eq*VOL_SWING*.400; /* .4v is the over drive voltage */
+ temp_power *= 2; /* differential wire */
+
+ l_wire.delay = delay - transmitter.delay;
+ l_wire.power.readOp.dynamic = temp_power - transmitter.power.readOp.dynamic;
+ l_wire.power.readOp.leakage = deviceType->Vdd*
+ (4* cmos_Isub_leakage(nsize, 0, 1, nmos));
+
+ l_wire.power.readOp.gate_leakage = deviceType->Vdd*
+ (4* cmos_Ig_leakage(nsize, 0, 1, nmos));
+
+ //double rt = horowitz(inputrise, timeconst, deviceType->Vth/deviceType->Vdd,
+ // deviceType->Vth/deviceType->Vdd, RISE)/deviceType->Vth;
+
+ delay += g_tp.sense_delay;
+
+ sense_amp.delay = g_tp.sense_delay;
+ out_rise_time = g_tp.sense_delay/(deviceType->Vth);
+ sense_amp.power.readOp.dynamic = g_tp.sense_dy_power;
+ sense_amp.power.readOp.leakage = 0; //FIXME
+ sense_amp.power.readOp.gate_leakage = 0;
+
+ power.readOp.dynamic = temp_power + sense_amp.power.readOp.dynamic;
+ power.readOp.leakage = transmitter.power.readOp.leakage +
+ l_wire.power.readOp.leakage +
+ sense_amp.power.readOp.leakage;
+ power.readOp.gate_leakage = transmitter.power.readOp.gate_leakage +
+ l_wire.power.readOp.gate_leakage +
+ sense_amp.power.readOp.gate_leakage;
+}
+
+ double
+Wire::sense_amp_input_cap()
+{
+ return drain_C_(g_tp.w_iso, PCH, 1, 1, g_tp.cell_h_def) +
+ gate_C(g_tp.w_sense_en + g_tp.w_sense_n, 0) +
+ drain_C_(g_tp.w_sense_n, NCH, 1, 1, g_tp.cell_h_def) +
+ drain_C_(g_tp.w_sense_p, PCH, 1, 1, g_tp.cell_h_def);
+}
+
+
+void Wire::delay_optimal_wire ()
+{
+ double len = wire_length;
+ //double min_wire_width = wire_width; //m
+ double beta = pmos_to_nmos_sz_ratio();
+ double switching = 0; // switching energy
+ double short_ckt = 0; // short-circuit energy
+ double tc = 0; // time constant
+ // input cap of min sized driver
+ double input_cap = gate_C(g_tp.min_w_nmos_ + min_w_pmos, 0);
+
+ // output parasitic capacitance of
+ // the min. sized driver
+ double out_cap = drain_C_(min_w_pmos, PCH, 1, 1, g_tp.cell_h_def) +
+ drain_C_(g_tp.min_w_nmos_, NCH, 1, 1, g_tp.cell_h_def);
+ // drive resistance
+ double out_res = (tr_R_on(g_tp.min_w_nmos_, NCH, 1) +
+ tr_R_on(min_w_pmos, PCH, 1))/2;
+ double wr = wire_res(len); //ohm
+
+ // wire cap /m
+ double wc = wire_cap(len);
+
+ // size the repeater such that the delay of the wire is minimum
+ double repeater_scaling = sqrt(out_res*wc/(wr*input_cap)); // len will cancel
+
+ // calc the optimum spacing between the repeaters (m)
+
+ repeater_spacing = sqrt(2 * out_res * (out_cap + input_cap)/
+ ((wr/len)*(wc/len)));
+ repeater_size = repeater_scaling;
+
+ switching = (repeater_scaling * (input_cap + out_cap) +
+ repeater_spacing * (wc/len)) * deviceType->Vdd * deviceType->Vdd;
+
+ tc = out_res * (input_cap + out_cap) +
+ out_res * wc/len * repeater_spacing/repeater_scaling +
+ wr/len * repeater_spacing * input_cap * repeater_scaling +
+ 0.5 * (wr/len) * (wc/len)* repeater_spacing * repeater_spacing;
+
+ delay = 0.693 * tc * len/repeater_spacing;
+
+#define Ishort_ckt 65e-6 /* across all tech Ref:Banerjee et al. {IEEE TED} */
+ short_ckt = deviceType->Vdd * g_tp.min_w_nmos_ * Ishort_ckt * 1.0986 *
+ repeater_scaling * tc;
+
+ area.set_area((len/repeater_spacing) *
+ compute_gate_area(INV, 1, min_w_pmos * repeater_scaling,
+ g_tp.min_w_nmos_ * repeater_scaling, g_tp.cell_h_def));
+ power.readOp.dynamic = ((len/repeater_spacing)*(switching + short_ckt));
+ power.readOp.leakage = ((len/repeater_spacing)*
+ deviceType->Vdd*
+ cmos_Isub_leakage(g_tp.min_w_nmos_*repeater_scaling, beta*g_tp.min_w_nmos_*repeater_scaling, 1, inv));
+ power.readOp.gate_leakage = ((len/repeater_spacing)*
+ deviceType->Vdd*
+ cmos_Ig_leakage(g_tp.min_w_nmos_*repeater_scaling, beta*g_tp.min_w_nmos_*repeater_scaling, 1, inv));
+}
+
+
+
+// calculate power/delay values for wires with suboptimal repeater sizing/spacing
+void
+Wire::init_wire(){
+ wire_length = 1;
+ delay_optimal_wire();
+ double sp, si;
+ powerDef pow;
+ si = repeater_size;
+ sp = repeater_spacing;
+ sp *= 1e6; // in microns
+
+ double i, j, del;
+ repeated_wire.push_back(Component());
+ for (j=sp; j < 4*sp; j+=100) {
+ for (i = si; i > 1; i--) {
+ pow = wire_model(j*1e-6, i, &del);
+ if (j == sp && i == si) {
+ global.delay = del;
+ global.power = pow;
+ global.area.h = si;
+ global.area.w = sp*1e-6; // m
+ }
+// cout << "Repeater size - "<< i <<
+// " Repeater spacing - " << j <<
+// " Delay - " << del <<
+// " PowerD - " << pow.readOp.dynamic <<
+// " PowerL - " << pow.readOp.leakage <<endl;
+ repeated_wire.back().delay = del;
+ repeated_wire.back().power.readOp = pow.readOp;
+ repeated_wire.back().area.w = j*1e-6; //m
+ repeated_wire.back().area.h = i;
+ repeated_wire.push_back(Component());
+
+ }
+ }
+ repeated_wire.pop_back();
+ update_fullswing();
+ Wire *l_wire = new Wire(Low_swing, 0.001/* 1 mm*/, 1);
+ low_swing.delay = l_wire->delay;
+ low_swing.power = l_wire->power;
+ delete l_wire;
+}
+
+
+
+void Wire::update_fullswing()
+{
+
+ list<Component>::iterator citer;
+ double del[4];
+ del[3] = this->global.delay + this->global.delay*.3;
+ del[2] = global.delay + global.delay*.2;
+ del[1] = global.delay + global.delay*.1;
+ del[0] = global.delay + global.delay*.05;
+ double threshold;
+ double ncost;
+ double cost;
+ int i = 4;
+ while (i>0) {
+ threshold = del[i-1];
+ cost = BIGNUM;
+ for (citer = repeated_wire.begin(); citer != repeated_wire.end(); citer++)
+ {
+ if (citer->delay > threshold) {
+ citer = repeated_wire.erase(citer);
+ citer --;
+ }
+ else {
+ ncost = citer->power.readOp.dynamic/global.power.readOp.dynamic +
+ citer->power.readOp.leakage/global.power.readOp.leakage;
+ if(ncost < cost)
+ {
+ cost = ncost;
+ if (i == 4) {
+ global_30.delay = citer->delay;
+ global_30.power = citer->power;
+ global_30.area = citer->area;
+ }
+ else if (i==3) {
+ global_20.delay = citer->delay;
+ global_20.power = citer->power;
+ global_20.area = citer->area;
+ }
+ else if(i==2) {
+ global_10.delay = citer->delay;
+ global_10.power = citer->power;
+ global_10.area = citer->area;
+ }
+ else if(i==1) {
+ global_5.delay = citer->delay;
+ global_5.power = citer->power;
+ global_5.area = citer->area;
+ }
+ }
+ }
+ }
+ i--;
+ }
+}
+
+
+
+powerDef Wire::wire_model (double space, double size, double *delay)
+{
+ powerDef ptemp;
+ double len = 1;
+ //double min_wire_width = wire_width; //m
+ double beta = pmos_to_nmos_sz_ratio();
+ // switching energy
+ double switching = 0;
+ // short-circuit energy
+ double short_ckt = 0;
+ // time constant
+ double tc = 0;
+ // input cap of min sized driver
+ double input_cap = gate_C (g_tp.min_w_nmos_ +
+ min_w_pmos, 0);
+
+ // output parasitic capacitance of
+ // the min. sized driver
+ double out_cap = drain_C_(min_w_pmos, PCH, 1, 1, g_tp.cell_h_def) +
+ drain_C_(g_tp.min_w_nmos_, NCH, 1, 1, g_tp.cell_h_def);
+ // drive resistance
+ double out_res = (tr_R_on(g_tp.min_w_nmos_, NCH, 1) +
+ tr_R_on(min_w_pmos, PCH, 1))/2;
+ double wr = wire_res(len); //ohm
+
+ // wire cap /m
+ double wc = wire_cap(len);
+
+ repeater_spacing = space;
+ repeater_size = size;
+
+ switching = (repeater_size * (input_cap + out_cap) +
+ repeater_spacing * (wc/len)) * deviceType->Vdd * deviceType->Vdd;
+
+ tc = out_res * (input_cap + out_cap) +
+ out_res * wc/len * repeater_spacing/repeater_size +
+ wr/len * repeater_spacing * out_cap * repeater_size +
+ 0.5 * (wr/len) * (wc/len)* repeater_spacing * repeater_spacing;
+
+ *delay = 0.693 * tc * len/repeater_spacing;
+
+#define Ishort_ckt 65e-6 /* across all tech Ref:Banerjee et al. {IEEE TED} */
+ short_ckt = deviceType->Vdd * g_tp.min_w_nmos_ * Ishort_ckt * 1.0986 *
+ repeater_size * tc;
+
+ ptemp.readOp.dynamic = ((len/repeater_spacing)*(switching + short_ckt));
+ ptemp.readOp.leakage = ((len/repeater_spacing)*
+ deviceType->Vdd*
+ cmos_Isub_leakage(g_tp.min_w_nmos_*repeater_size, beta*g_tp.min_w_nmos_*repeater_size, 1, inv));
+
+ ptemp.readOp.gate_leakage = ((len/repeater_spacing)*
+ deviceType->Vdd*
+ cmos_Ig_leakage(g_tp.min_w_nmos_*repeater_size, beta*g_tp.min_w_nmos_*repeater_size, 1, inv));
+
+ return ptemp;
+}
+
+void
+Wire::print_wire()
+{
+
+ cout << "\nWire Properties:\n\n";
+ cout << " Delay Optimal\n\tRepeater size - "<< global.area.h <<
+ " \n\tRepeater spacing - " << global.area.w*1e3 << " (mm)"
+ " \n\tDelay - " << global.delay*1e6 << " (ns/mm)"
+ " \n\tPowerD - " << global.power.readOp.dynamic *1e6<< " (nJ/mm)"
+ " \n\tPowerL - " << global.power.readOp.leakage << " (mW/mm)"
+ " \n\tPowerLgate - " << global.power.readOp.gate_leakage << " (mW/mm)\n";
+ cout << "\tWire width - " <<wire_width_init*1e6 << " microns\n";
+ cout << "\tWire spacing - " <<wire_spacing_init*1e6 << " microns\n";
+ cout <<endl;
+
+ cout << " 5% Overhead\n\tRepeater size - "<< global_5.area.h <<
+ " \n\tRepeater spacing - " << global_5.area.w*1e3 << " (mm)"
+ " \n\tDelay - " << global_5.delay *1e6<< " (ns/mm)"
+ " \n\tPowerD - " << global_5.power.readOp.dynamic *1e6<< " (nJ/mm)"
+ " \n\tPowerL - " << global_5.power.readOp.leakage << " (mW/mm)"
+ " \n\tPowerLgate - " << global_5.power.readOp.gate_leakage << " (mW/mm)\n";
+ cout << "\tWire width - " <<wire_width_init*1e6 << " microns\n";
+ cout << "\tWire spacing - " <<wire_spacing_init*1e6 << " microns\n";
+ cout <<endl;
+ cout << " 10% Overhead\n\tRepeater size - "<< global_10.area.h <<
+ " \n\tRepeater spacing - " << global_10.area.w*1e3 << " (mm)"
+ " \n\tDelay - " << global_10.delay *1e6<< " (ns/mm)"
+ " \n\tPowerD - " << global_10.power.readOp.dynamic *1e6<< " (nJ/mm)"
+ " \n\tPowerL - " << global_10.power.readOp.leakage << " (mW/mm)"
+ " \n\tPowerLgate - " << global_10.power.readOp.gate_leakage << " (mW/mm)\n";
+ cout << "\tWire width - " <<wire_width_init*1e6 << " microns\n";
+ cout << "\tWire spacing - " <<wire_spacing_init*1e6 << " microns\n";
+ cout <<endl;
+ cout << " 20% Overhead\n\tRepeater size - "<< global_20.area.h <<
+ " \n\tRepeater spacing - " << global_20.area.w*1e3 << " (mm)"
+ " \n\tDelay - " << global_20.delay *1e6<< " (ns/mm)"
+ " \n\tPowerD - " << global_20.power.readOp.dynamic *1e6<< " (nJ/mm)"
+ " \n\tPowerL - " << global_20.power.readOp.leakage << " (mW/mm)"
+ " \n\tPowerLgate - " << global_20.power.readOp.gate_leakage << " (mW/mm)\n";
+ cout << "\tWire width - " <<wire_width_init*1e6 << " microns\n";
+ cout << "\tWire spacing - " <<wire_spacing_init*1e6 << " microns\n";
+ cout <<endl;
+ cout << " 30% Overhead\n\tRepeater size - "<< global_30.area.h <<
+ " \n\tRepeater spacing - " << global_30.area.w*1e3 << " (mm)"
+ " \n\tDelay - " << global_30.delay *1e6<< " (ns/mm)"
+ " \n\tPowerD - " << global_30.power.readOp.dynamic *1e6<< " (nJ/mm)"
+ " \n\tPowerL - " << global_30.power.readOp.leakage << " (mW/mm)"
+ " \n\tPowerLgate - " << global_30.power.readOp.gate_leakage << " (mW/mm)\n";
+ cout << "\tWire width - " <<wire_width_init*1e6 << " microns\n";
+ cout << "\tWire spacing - " <<wire_spacing_init*1e6 << " microns\n";
+ cout <<endl;
+ cout << " Low-swing wire (1 mm) - Note: Unlike repeated wires, \n\tdelay and power "
+ "values of low-swing wires do not\n\thave a linear relationship with length." <<
+ " \n\tdelay - " << low_swing.delay *1e9<< " (ns)"
+ " \n\tpowerD - " << low_swing.power.readOp.dynamic *1e9<< " (nJ)"
+ " \n\tPowerL - " << low_swing.power.readOp.leakage << " (mW)"
+ " \n\tPowerLgate - " << low_swing.power.readOp.gate_leakage << " (mW)\n";
+ cout << "\tWire width - " <<wire_width_init * 2 /* differential */<< " microns\n";
+ cout << "\tWire spacing - " <<wire_spacing_init * 2 /* differential */<< " microns\n";
+ cout <<endl;
+ cout <<endl;
+
+}
+